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Issue Date
Title
Author(s)
2008
On the detection of missing gate faults in reversible circuits by a universal test set
Rahaman, H
;
Kole, D K
;
Das, D K
;
Bhattacharya, Bhargab B
1985
Testable design of RMC networks with at and bridging faults
Bhattacharya, Bhargab B
;
Gupta, B
;
Sarkar, S
;
Choudhury, A K
Discover
Author
2
Bhattacharya, Bhargab B
1
Choudhury, A K
1
Das, D K
1
Gupta, B
1
Kole, D K
1
Rahaman, H
1
Sarkar, S
Subject
1
Fault location
1
Logic
1
Missing gate faults
1
Networks
1
Quantum computing
1
Reversible logic
1
Universal test set
Date issued
1
2000 - 2008
1
1985 - 1989