Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/2189
Title: Studies on isomorphic-redundancy and testing of non-scan sequential circuits
Authors: Das, Jaydeep
Keywords: Isomorphic redundancy
Non-scan sequential circuits
Issue Date: 1992
Publisher: Indian Statistical Institute
Citation: 42p.
Series/Report no.: ;Diss-7
Description: M Tech
URI: http://hdl.handle.net/10263/2189
Appears in Collections:Dissertations

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