Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/2293| Title: | An efficient scan tree design for compact test pattern set |
| Authors: | Banerjee, S Roychowdhury, D Bhattacharya, Bhargab B |
| Keywords: | Design for testability Scan path Space compaction Stuck at faults Testing Very large scale integration |
| Issue Date: | 2007 |
| Citation: | IEEE transaction on pattern analysis and machine intelligence,V29,9,P1590-1602 |
| URI: | http://hdl.handle.net/10263/2293 |
| Appears in Collections: | Mathematics and Statistics |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| an efficient scan tree design for compact test pattern set.pdf | 337.55 kB | Adobe PDF | View/Open |
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