Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/2493| Title: | On the detection of missing gate faults in reversible circuits by a universal test set |
| Authors: | Rahaman, H Kole, D K Das, D K Bhattacharya, Bhargab B |
| Keywords: | Missing gate faults Quantum computing Reversible logic Testable design Universal test set |
| Issue Date: | 2008 |
| Citation: | Proceedings of 21st international conference on VLSI design,P163-168 |
| URI: | http://hdl.handle.net/10263/2493 |
| Appears in Collections: | Computer Science |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Binder10.pdf | 1.36 MB | Adobe PDF | View/Open |
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