On the detection of missing gate faults in reversible circuits by a universal test set

Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/2493

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DC Field	Value	Language
dc.contributor.author	Rahaman, H	-
dc.contributor.author	Kole, D K	-
dc.contributor.author	Das, D K	-
dc.contributor.author	Bhattacharya, Bhargab B	-
dc.date.accessioned	2011-08-11T11:46:59Z	-
dc.date.available	2011-08-11T11:46:59Z	-
dc.date.issued	2008	-
dc.identifier.citation	Proceedings of 21st international conference on VLSI design,P163-168	en_US
dc.identifier.uri	http://hdl.handle.net/10263/2493	-
dc.language.iso	en	en_US
dc.subject	Missing gate faults	en_US
dc.subject	Quantum computing	en_US
dc.subject	Reversible logic	en_US
dc.subject	Testable design	en_US
dc.subject	Universal test set	en_US
dc.title	On the detection of missing gate faults in reversible circuits by a universal test set	en_US
dc.type	Article	en_US
Appears in Collections:	Computer Science

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