Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/2575
Title: Mapping symmetric functions to hiererchical modules for path-delay fault testability
Authors: Rahaman, H
Das, D K
Bhattacharya, Bhargab B
Das, S K
Keywords: Symmetric functions
Hierarchical
Issue Date: 2006
Citation: Journal of electronic testing - theory and applicationsV22,2,P125-142
URI: http://hdl.handle.net/10263/2575
Appears in Collections:Mathematics and Statistics

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