Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/2680
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dc.contributor.authorGhosh, A K-
dc.contributor.authorChaudhuri, P-
dc.date.accessioned2012-01-01T17:15:19Z-
dc.date.available2012-01-01T17:15:19Z-
dc.date.issued2005-
dc.identifier.citationBemoulli,V11,P1-27en_US
dc.identifier.urihttp://hdl.handle.net/10263/2680-
dc.language.isoenen_US
dc.subjectBayes risken_US
dc.subjectElliptic symmetryen_US
dc.subjectGeneralized U statisticsen_US
dc.subjectHalf-space depthen_US
dc.subjectLinear discriminant analysisen_US
dc.subjectLocation shift modelsen_US
dc.subjectMisclassification ratesen_US
dc.subjectOptimal bayes classifieren_US
dc.subjectQuadratic discriminant analysisen_US
dc.subjectRegression depthen_US
dc.subjectRobustnessen_US
dc.subjectVapnik chervonenkis dimensionen_US
dc.titleData depth and distribution-free discriminant analysis using separating surfacesen_US
dc.typeArticleen_US
Appears in Collections:Mathematics and Statistics

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