Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/3060| Title: | Testing of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuits |
| Authors: | Rahaman, H Das, D K Bhattacharya, Bhargab B |
| Keywords: | EXOR CMOS circuits |
| Issue Date: | 2004 |
| Citation: | IEEE proceedings of computers and digital techniques,V151,P83-93 |
| URI: | http://hdl.handle.net/10263/3060 |
| Appears in Collections: | Computer Science |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Binder1.pdf | 1.89 MB | Adobe PDF | View/Open |
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