Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/3060Full metadata record
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Rahaman, H | - |
| dc.contributor.author | Das, D K | - |
| dc.contributor.author | Bhattacharya, Bhargab B | - |
| dc.date.accessioned | 2012-01-24T18:42:42Z | - |
| dc.date.available | 2012-01-24T18:42:42Z | - |
| dc.date.issued | 2004 | - |
| dc.identifier.citation | IEEE proceedings of computers and digital techniques,V151,P83-93 | en_US |
| dc.identifier.uri | http://hdl.handle.net/10263/3060 | - |
| dc.language.iso | en | en_US |
| dc.subject | EXOR | en_US |
| dc.subject | CMOS circuits | en_US |
| dc.title | Testing of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuits | en_US |
| dc.type | Article | en_US |
| Appears in Collections: | Computer Science | |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Binder1.pdf | 1.89 MB | Adobe PDF | View/Open |
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