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Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/3851
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dc.contributor.authorSengupta, A-
dc.contributor.authorPal, Chandranath-
dc.date.accessioned2012-05-07T18:41:03Z-
dc.date.available2012-05-07T18:41:03Z-
dc.date.issued2000-
dc.identifier.citationLifetime data analysis,V6,P281-290en_US
dc.identifier.urihttp://hdl.handle.net/10263/3851-
dc.language.isoenen_US
dc.subjectContamination modelen_US
dc.subjectOptimal testsen_US
dc.subjectPivotal parametricen_US
dc.subjectReliability distributionen_US
dc.titleOptimal tests of no contamination in reliability modelsen_US
dc.typeArticleen_US
Appears in Collections:Mathematics and Statistics

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