Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/4049
Title: Simulated annealing based pattern classification
Authors: Bandyopadhyay, Sanghamitra
Pal, Sankar K
Murthy, C A
Keywords: Pattern recognition
Evolutionary computation
Genetic algorithms
Bayes
Error probability
Issue Date: 1998
Citation: Information sciences,V109,P165-184
URI: http://hdl.handle.net/10263/4049
Appears in Collections:Electronics

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