Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/4326| Title: | Bayesian analysis of incomplete time and cause of failure data |
| Authors: | Mukhopadhyay, C Basu, A P |
| Keywords: | Series system Competing risks Weibull distribution Masking |
| Issue Date: | 1996 |
| Citation: | Journal of statistical planning and inference,V59,P79-100 |
| URI: | http://hdl.handle.net/10263/4326 |
| Appears in Collections: | Statistical Quality Control |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Binder2.pdf | 2.92 MB | Adobe PDF | View/Open |
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