Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/4677| Title: | Fixed width confidence interval of P ( X < Y ) in partial sequential sampling scheme |
| Authors: | Bandyopadhyay, Uttam Das, Radhakanta Biswas, Atanu |
| Keywords: | Fixed width confidence interval Partial sequential sampling scheme Wiener process Asymptotic relative efficiency |
| Issue Date: | 2003 |
| Citation: | Sequential Analysis,v.22,no.1&2,p.75-93 |
| URI: | http://hdl.handle.net/10263/4677 |
| Appears in Collections: | Mathematics and Statistics |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Fixed Width Confidence Interval of P.pdf | 12.76 MB | Adobe PDF | View/Open |
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