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Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/4677
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dc.contributor.authorBandyopadhyay, Uttam-
dc.contributor.authorDas, Radhakanta-
dc.contributor.authorBiswas, Atanu-
dc.date.accessioned2012-11-02T11:25:37Z-
dc.date.available2012-11-02T11:25:37Z-
dc.date.issued2003-
dc.identifier.citationSequential Analysis,v.22,no.1&2,p.75-93en_US
dc.identifier.urihttp://hdl.handle.net/10263/4677-
dc.language.isoenen_US
dc.subjectFixed width confidence intervalen_US
dc.subjectPartial sequential sampling schemeen_US
dc.subjectWiener processen_US
dc.subjectAsymptotic relative efficiencyen_US
dc.titleFixed width confidence interval of P ( X < Y ) in partial sequential sampling schemeen_US
dc.typeArticleen_US
Appears in Collections:Mathematics and Statistics

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