1. DSpace at Indian Statistical Institute
  2. Scientific Contributions of ISI
  3. Electronics
Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/4698
Full metadata record
DC FieldValueLanguage
dc.contributor.authorMukherjee, Dipti Prasad-
dc.contributor.authorZisserman, Andrew-
dc.contributor.authorBrady, Michael-
dc.date.accessioned2012-11-05T06:50:59Z-
dc.date.available2012-11-05T06:50:59Z-
dc.date.issued1995-
dc.identifier.citationPhilosophical Transactions of Research Society of London , v 351, no. p 77-106en_US
dc.identifier.urihttp://hdl.handle.net/10263/4698-
dc.language.isoenen_US
dc.relation.ispartofseriesA;-
dc.subjectShape from symmetryen_US
dc.subjectExploiting symmetryen_US
dc.subjectAffine imagesen_US
dc.titleShape from symmetry : detecting and exploiting symmetry in affine imagesen_US
dc.typeArticleen_US
Appears in Collections:Electronics

Files in This Item:
File Description SizeFormat 
shape from symmetry-detecting and exploiting symmetry in affine images.pdf4.4 MBAdobe PDFView/Open
Show simple item record


Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.