Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/5769| Title: | Bayesian robustness for multiparameter problems |
| Authors: | Delampady, Mohan Dey, Dipak K |
| Keywords: | Phi-divergence Contaminatation Curvature |
| Issue Date: | 1994 |
| Citation: | Journal of Statistical Planning and Inference, v 40, no 1, p 375-382 |
| URI: | http://hdl.handle.net/10263/5769 |
| Appears in Collections: | Mathematics and Statistics |
Files in This Item:
| File | Description | Size | Format | |
|---|---|---|---|---|
| Bayesian robustness for multiparameter..JOSPAI-40-1-1994- p 375-382.pdf | 372.4 kB | Adobe PDF | View/Open |
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