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Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/5769
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dc.contributor.authorDelampady, Mohan-
dc.contributor.authorDey, Dipak K-
dc.date.accessioned2014-01-20T06:59:34Z-
dc.date.available2014-01-20T06:59:34Z-
dc.date.issued1994-
dc.identifier.citationJournal of Statistical Planning and Inference, v 40, no 1, p 375-382en_US
dc.identifier.urihttp://hdl.handle.net/10263/5769-
dc.language.isoenen_US
dc.subjectPhi-divergenceen_US
dc.subjectContaminatationen_US
dc.subjectCurvatureen_US
dc.titleBayesian robustness for multiparameter problemsen_US
dc.typeArticleen_US
Appears in Collections:Mathematics and Statistics

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