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Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/6374
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dc.contributor.authorLahiri, Subhra-
dc.date.accessioned2016-07-06T17:31:45Z-
dc.date.available2016-07-06T17:31:45Z-
dc.date.issued2007-
dc.identifier.citation44p.en_US
dc.identifier.urihttp://hdl.handle.net/10263/6374-
dc.descriptionDissertation under the supervision of Prof. Bhargab B. Bhattacharyaen_US
dc.language.isoenen_US
dc.publisherIndian Statistical Institute, Kolkataen_US
dc.relation.ispartofseriesDissertation;2007-211-
dc.subjectHybrid scanen_US
dc.subjectDFTen_US
dc.subjectEnergy/power reductionen_US
dc.subjectISCAS-89en_US
dc.titleTree-based hybrid scan architecture for VLSI testingen_US
dc.typeThesisen_US
Appears in Collections:Dissertations - M Tech (CS)

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