Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/6520
Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | Shewhart, W A | - |
dc.date.accessioned | 2016-08-04T20:16:57Z | - |
dc.date.available | 2016-08-04T20:16:57Z | - |
dc.date.issued | 1948-05 | - |
dc.identifier.citation | Massachusetts Institute of Technology, p.1-17 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/6520 | - |
dc.language.iso | en | en_US |
dc.publisher | Massachusetts Institute of Technology, Cambridge | en_US |
dc.relation.ispartofseries | Reprint;R536 | - |
dc.subject | Quality control | en_US |
dc.subject | Industrial research | en_US |
dc.title | Future of statistics in industrial research and quality control | en_US |
dc.type | Article | en_US |
Appears in Collections: | Lectures |
Files in This Item:
File | Description | Size | Format | |
---|---|---|---|---|
Future of statistics in industrial research and quality control.pdf | Scan copy | 557.92 kB | Adobe PDF | View/Open |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.