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Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/6548
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dc.contributor.authorShewhart, W A-
dc.date.accessioned2016-08-22T19:59:33Z-
dc.date.available2016-08-22T19:59:33Z-
dc.date.issued1946-09-27-
dc.identifier.citationISI, p.1-12en_US
dc.identifier.urihttp://hdl.handle.net/10263/6548-
dc.descriptionConference presented at Newark College of Engineeringen_US
dc.language.isoenen_US
dc.publisherIndian Statistical Institute, Kolkataen_US
dc.relation.ispartofseriesReprint;R437-
dc.subjectSamplingen_US
dc.subjectApplied scienceen_US
dc.titleReasons for samplingen_US
dc.typeArticleen_US
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