Please use this identifier to cite or link to this item:
http://hdl.handle.net/10263/6582
Full metadata record
DC Field | Value | Language |
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dc.contributor.author | Shewhart, W A | - |
dc.date.accessioned | 2016-09-09T15:50:47Z | - |
dc.date.available | 2016-09-09T15:50:47Z | - |
dc.date.issued | 1929-12-05 | - |
dc.identifier.citation | Journal of Bell Telephone Laboratories, p.1-22 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/6582 | - |
dc.description | Paper presented at the American society of mechanical engineers and the American society for testing materials, New York | en_US |
dc.language.iso | en | en_US |
dc.publisher | Bell Telephone Laboratories | en_US |
dc.relation.ispartofseries | Reprint;R328 | - |
dc.subject | Management | en_US |
dc.subject | Quality control | en_US |
dc.title | New era and what it means | en_US |
dc.type | Article | en_US |
Appears in Collections: | Lectures |
Files in This Item:
File | Description | Size | Format | |
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New era and what it means.pdf | Scan copy | 962.39 kB | Adobe PDF | View/Open |
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