Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/6861
Title: Basic process capability indices: an expository review
Authors: Anis, M Z
Keywords: Autocorrelation
Measurement error
Nonnormality
Sample size
Skewed distribution
Statistical variance
Issue Date: 2008
Citation: International Statistical Review / Revue Internationale de Statistique, v.76, no.3, p.347-367
URI: http://hdl.handle.net/10263/6861
Appears in Collections:Mathematics and Statistics

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