Please use this identifier to cite or link to this item: http://hdl.handle.net/10263/901
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dc.contributor.authorChaudhuri, B B-
dc.date.accessioned2011-01-19T07:34:24Z-
dc.date.available2011-01-19T07:34:24Z-
dc.date.issued1982-
dc.identifier.citationInternational Journal of Systems Scienceen_US
dc.identifier.urihttp://hdl.handle.net/10263/901-
dc.language.isoenen_US
dc.subjectNoise environmenten_US
dc.subjectPattern recognitionen_US
dc.subjectBayer's ruleen_US
dc.titleBayer's error and its sensitivity in statistical pattern recognition in noisy environmenten_US
dc.typeArticleen_US
Appears in Collections:Computer Science

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