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Issue Date
Title
Author(s)
2008
On the detection of missing gate faults in reversible circuits by a universal test set
Rahaman, H
;
Kole, D K
;
Das, D K
;
Bhattacharya, Bhargab B
2006
Mapping symmetric functions to hiererchical modules for path-delay fault testability
Rahaman, H
;
Das, D K
;
Bhattacharya, Bhargab B
;
Das, S K
2006
Shortest monotone descent path problem in polyhedral terrain
Roy, S
;
Das, D K
;
Bhattacharya, Bhargab B
2004
Testing of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuits
Rahaman, H
;
Das, D K
;
Bhattacharya, Bhargab B
2000
Synthesis of symmetric functions for path delay fault testability
Chakrabarti, S
;
Das, S
;
Das, D K
;
Bhattacharya, Bhargab B
Discover
Author
3
Rahaman, H
1
Chakrabarti, S
1
Das, S
1
Das, S K
1
Kole, D K
1
Roy, S
Subject
1
Algorithm
1
CMOS circuits
1
Complexity
1
Delay fault
1
EXOR
1
Hierarchical
1
Missing gate faults
1
Polyhedral terrain
1
Quantum computing
1
Reversible logic
.
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