Studies on isomorphic-redundancy and testing of non-scan sequential circuits

dc.contributor.author	Das, Jaydeep
dc.date.accessioned	2011-06-10T07:48:49Z
dc.date.available	2011-06-10T07:48:49Z
dc.date.issued	1992
dc.identifier.citation	42p.	en_US
dc.identifier.uri	http://hdl.handle.net/10263/2189
dc.description	M Tech	en_US
dc.description.sponsorship	Guide: Bhargab B Bhattacharya	en_US
dc.language.iso	en	en_US
dc.publisher	Indian Statistical Institute	en_US
dc.relation.ispartofseries	;Diss-7
dc.subject	Isomorphic redundancy	en_US
dc.subject	Non-scan sequential circuits	en_US
dc.title	Studies on isomorphic-redundancy and testing of non-scan sequential circuits	en_US
dc.type	Thesis	en_US