On the detection of missing gate faults in reversible circuits by a universal test set

dc.contributor.author	Rahaman, H
dc.contributor.author	Kole, D K
dc.contributor.author	Das, D K
dc.contributor.author	Bhattacharya, Bhargab B
dc.date.accessioned	2011-08-11T11:46:59Z
dc.date.available	2011-08-11T11:46:59Z
dc.date.issued	2008
dc.identifier.citation	Proceedings of 21st international conference on VLSI design,P163-168	en_US
dc.identifier.uri	http://hdl.handle.net/10263/2493
dc.language.iso	en	en_US
dc.subject	Missing gate faults	en_US
dc.subject	Quantum computing	en_US
dc.subject	Reversible logic	en_US
dc.subject	Testable design	en_US
dc.subject	Universal test set	en_US
dc.title	On the detection of missing gate faults in reversible circuits by a universal test set	en_US
dc.type	Article	en_US