Mapping symmetric functions to hiererchical modules for path-delay fault testability

dc.contributor.author	Rahaman, H
dc.contributor.author	Das, D K
dc.contributor.author	Bhattacharya, Bhargab B
dc.contributor.author	Das, S K
dc.date.accessioned	2011-09-19T11:24:20Z
dc.date.available	2011-09-19T11:24:20Z
dc.date.issued	2006
dc.identifier.citation	Journal of electronic testing - theory and applicationsV22,2,P125-142	en_US
dc.identifier.uri	http://hdl.handle.net/10263/2575
dc.language.iso	en	en_US
dc.subject	Symmetric functions	en_US
dc.subject	Hierarchical	en_US
dc.title	Mapping symmetric functions to hiererchical modules for path-delay fault testability	en_US
dc.type	Article	en_US