Zero-aliasing space compaction of test response using a single periodic output

dc.contributor.author	Bhattacharya, Bhargab B
dc.contributor.author	Gossel, Michael
dc.date.accessioned	2012-01-24T17:45:06Z
dc.date.available	2012-01-24T17:45:06Z
dc.date.issued	2003
dc.identifier.citation	IEEE transactions on computerrs,V52,P1646-1651	en_US
dc.identifier.uri	http://hdl.handle.net/10263/3055
dc.language.iso	en	en_US
dc.subject	Space compaction	en_US
dc.subject	Stuck at faults	en_US
dc.subject	System-on a chip	en_US
dc.subject	Testing	en_US
dc.title	Zero-aliasing space compaction of test response using a single periodic output	en_US
dc.type	Article	en_US