Testing of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuits

dc.contributor.author	Rahaman, H
dc.contributor.author	Das, D K
dc.contributor.author	Bhattacharya, Bhargab B
dc.date.accessioned	2012-01-24T18:42:42Z
dc.date.available	2012-01-24T18:42:42Z
dc.date.issued	2004
dc.identifier.citation	IEEE proceedings of computers and digital techniques,V151,P83-93	en_US
dc.identifier.uri	http://hdl.handle.net/10263/3060
dc.language.iso	en	en_US
dc.subject	EXOR	en_US
dc.subject	CMOS circuits	en_US
dc.title	Testing of stuck-open faults in generalized reedmuller and EXOR sum of products CMOS circuits	en_US
dc.type	Article	en_US