Optimal tests of no contamination in reliability models

dc.contributor.author	Sengupta, A
dc.contributor.author	Pal, Chandranath
dc.date.accessioned	2012-05-07T18:41:03Z
dc.date.available	2012-05-07T18:41:03Z
dc.date.issued	2000
dc.identifier.citation	Lifetime data analysis,V6,P281-290	en_US
dc.identifier.uri	http://hdl.handle.net/10263/3851
dc.language.iso	en	en_US
dc.subject	Contamination model	en_US
dc.subject	Optimal tests	en_US
dc.subject	Pivotal parametric	en_US
dc.subject	Reliability distribution	en_US
dc.title	Optimal tests of no contamination in reliability models	en_US
dc.type	Article	en_US