Bayesian analysis  of incomplete time and cause of failure data

dc.contributor.author	Mukhopadhyay, C
dc.contributor.author	Basu, A P
dc.date.accessioned	2012-06-13T15:38:22Z
dc.date.available	2012-06-13T15:38:22Z
dc.date.issued	1996
dc.identifier.citation	Journal of statistical planning and inference,V59,P79-100	en_US
dc.identifier.uri	http://hdl.handle.net/10263/4326
dc.language.iso	en	en_US
dc.subject	Series system	en_US
dc.subject	Competing risks	en_US
dc.subject	Weibull distribution	en_US
dc.subject	Masking	en_US
dc.title	Bayesian analysis of incomplete time and cause of failure data	en_US
dc.type	Article	en_US