Pattern recognition when feature variables are subject to error

dc.contributor.author	Das Gupta, Somesh
dc.date.accessioned	2012-07-30T11:01:14Z
dc.date.available	2012-07-30T11:01:14Z
dc.date.issued	1989
dc.identifier.citation	Sankhya, Seris B , v.51 , no.3, p.287-294	en_US
dc.identifier.uri	http://hdl.handle.net/10263/4501
dc.language.iso	en	en_US
dc.subject	Bayes rule	en_US
dc.subject	Features subjected to noise	en_US
dc.subject	Effect of noise distribution	en_US
dc.title	Pattern recognition when feature variables are subject to error	en_US
dc.type	Article	en_US