dc.contributor.author |
Bandyopadhyay, Uttam |
|
dc.contributor.author |
Das, Radhakanta |
|
dc.contributor.author |
Biswas, Atanu |
|
dc.date.accessioned |
2012-11-02T11:25:37Z |
|
dc.date.available |
2012-11-02T11:25:37Z |
|
dc.date.issued |
2003 |
|
dc.identifier.citation |
Sequential Analysis,v.22,no.1&2,p.75-93 |
en_US |
dc.identifier.uri |
http://hdl.handle.net/10263/4677 |
|
dc.language.iso |
en |
en_US |
dc.subject |
Fixed width confidence interval |
en_US |
dc.subject |
Partial sequential sampling scheme |
en_US |
dc.subject |
Wiener process |
en_US |
dc.subject |
Asymptotic relative efficiency |
en_US |
dc.title |
Fixed width confidence interval of P ( X < Y ) in partial sequential sampling scheme |
en_US |
dc.type |
Article |
en_US |