dc.contributor.author | Delampady, Mohan | |
dc.contributor.author | Dey, Dipak K | |
dc.date.accessioned | 2014-01-20T06:59:34Z | |
dc.date.available | 2014-01-20T06:59:34Z | |
dc.date.issued | 1994 | |
dc.identifier.citation | Journal of Statistical Planning and Inference, v 40, no 1, p 375-382 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/5769 | |
dc.language.iso | en | en_US |
dc.subject | Phi-divergence | en_US |
dc.subject | Contaminatation | en_US |
dc.subject | Curvature | en_US |
dc.title | Bayesian robustness for multiparameter problems | en_US |
dc.type | Article | en_US |