dc.contributor.author | Dutta, Tridib K | |
dc.contributor.author | Mukherjee, S P | |
dc.date.accessioned | 2014-03-27T12:59:24Z | |
dc.date.available | 2014-03-27T12:59:24Z | |
dc.date.issued | 1997 | |
dc.identifier.citation | IAPQR Transactions, v 22, no 1, p 63-80 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/5874 | |
dc.language.iso | en | en_US |
dc.subject | Optimum sampling plan | en_US |
dc.subject | Defect inteference | en_US |
dc.subject | Detection of independent defect categories | en_US |
dc.title | Optimum sampling plan for detection of independent defect categories in case of defect inteference | en_US |
dc.type | Article | en_US |