Testable design of RMC networks with at and bridging faults

dc.contributor.author	Bhattacharya, Bhargab B
dc.contributor.author	Gupta, B
dc.contributor.author	Sarkar, S
dc.contributor.author	Choudhury, A K
dc.date.accessioned	2014-06-13T10:12:31Z
dc.date.available	2014-06-13T10:12:31Z
dc.date.issued	1985
dc.identifier.citation	IEE Proceedings, V.132. No.3, P 155-162	en_US
dc.identifier.uri	http://hdl.handle.net/10263/5920
dc.language.iso	en	en_US
dc.subject	Networks	en_US
dc.subject	Logic	en_US
dc.subject	Fault location	en_US
dc.subject	Testable design	en_US
dc.title	Testable design of RMC networks with at and bridging faults	en_US
dc.type	Article	en_US