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Tree-based hybrid scan architecture for VLSI testing
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Tree-based hybrid scan architecture for VLSI testing
Lahiri, Subhra
URI:
http://hdl.handle.net/10263/6374
Date:
2007
Description:
Dissertation under the supervision of Prof. Bhargab B. Bhattacharya
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Dissertations - M Tech (CS)
M Tech (Computer Science)
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