Tree-based hybrid scan architecture for VLSI testing

dc.contributor.author	Lahiri, Subhra
dc.date.accessioned	2016-07-06T17:31:45Z
dc.date.available	2016-07-06T17:31:45Z
dc.date.issued	2007
dc.identifier.citation	44p.	en_US
dc.identifier.uri	http://hdl.handle.net/10263/6374
dc.description	Dissertation under the supervision of Prof. Bhargab B. Bhattacharya	en_US
dc.language.iso	en	en_US
dc.publisher	Indian Statistical Institute, Kolkata	en_US
dc.relation.ispartofseries	Dissertation;2007-211
dc.subject	Hybrid scan	en_US
dc.subject	DFT	en_US
dc.subject	Energy/power reduction	en_US
dc.subject	ISCAS-89	en_US
dc.title	Tree-based hybrid scan architecture for VLSI testing	en_US
dc.type	Thesis	en_US