dc.contributor.author | Shewhart, W A | |
dc.date.accessioned | 2016-08-31T21:25:43Z | |
dc.date.available | 2016-08-31T21:25:43Z | |
dc.date.issued | 1933 | |
dc.identifier.citation | Bell Telephone Laboratories, p.1-8 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/6566 | |
dc.language.iso | en | en_US |
dc.publisher | Bell Telephone Laboratories | en_US |
dc.relation.ispartofseries | Reprint;R558 | |
dc.subject | Inspection engineering | en_US |
dc.subject | Quality control | en_US |
dc.title | Inspection engineering | en_US |
dc.type | Article | en_US |