dc.contributor.author | Anis, M Z | |
dc.date.accessioned | 2017-12-20T09:21:01Z | |
dc.date.available | 2017-12-20T09:21:01Z | |
dc.date.issued | 2008 | |
dc.identifier.citation | International Statistical Review / Revue Internationale de Statistique, v.76, no.3, p.347-367 | en_US |
dc.identifier.uri | http://hdl.handle.net/10263/6861 | |
dc.language.iso | en | en_US |
dc.subject | Autocorrelation | en_US |
dc.subject | Measurement error | en_US |
dc.subject | Nonnormality | en_US |
dc.subject | Sample size | en_US |
dc.subject | Skewed distribution | en_US |
dc.subject | Statistical variance | en_US |
dc.title | Basic process capability indices: an expository review | en_US |
dc.type | Article | en_US |