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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

By:

Bushnell Michael L

Contributor(s):

Agrawal Vishwani D [Auth.]

Material type: Text

Text

TextLanguage: English Series: Frontiers in electronic testingPublication details: Boston Kluwer Academic 2000Description: xviii,690pISBN:

0-7923-799-1-8

Subject(s):

DDC classification:

621.395 B979

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	ISI Library, Kolkata	621.395 B979 (Browse shelf(Opens below))	Available		121422

Total holds: 0

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