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VLSI Test principles and architectures design for testability

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Material type: Text

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TextLanguage: English Series: Morgan Kauffman series in systems on siliconPublication details: Amsterdam Morgan Kaufmann 2006Description: xxx,777pISBN:

0-12-370597-5

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DDC classification:

621.395 W246

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	ISI Library, Kolkata	621.395 W246 (Browse shelf(Opens below))	Available		127493

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