Online Public Access Catalogue (OPAC)
Library,Documentation and Information Science Division

“A research journal serves that narrow

borderland which separates the known from the unknown”

-P.C.Mahalanobis

Purchase suggestions

Amazon cover image

Image from Amazon.com

Normal view MARC view ISBD view

Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

By:

Bushnell Michael L

Contributor(s):

Agrawal Vishwani D [Auth.]

Material type: Text

Text

TextLanguage: English Series: Frontiers in electronic testingPublication details: Boston Kluwer Academic 2000Description: xviii,690pISBN:

0-7923-799-1-8

Subject(s):

DDC classification:

621.395 B979

Tags from this library: No tags from this library for this title. Log in to add tags.

Holdings ( 1 )
Comments ( 0 )

Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	ISI Library, Kolkata	621.395 B979 (Browse shelf(Opens below))	Available		121422

Total holds: 0

There are no comments on this title.

to post a comment.

Place hold
Print
Add to your cart (remove)
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com)

Library, Documentation and Information Science Division, Indian Statistical Institute, 203 B T Road, Kolkata 700108, INDIA
Phone no. 91-33-2575 2100, Fax no. 91-33-2578 1412, ksatpathy@isical.ac.in