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Essentials of electronic testing for digital, memory and mixed-signal VLSI circuits

By: Bushnell Michael L.
Contributor(s): Agrawal Vishwani D [Auth.].
Material type: TextTextSeries: Frontiers in electronic testing. Publisher: Boston Kluwer Academic 2000Description: xviii,690p.ISBN: 0-7923-799-1-8.Subject(s): Digital integrated circuits-testing | Integrated circuits-testing | Mixed signal circuits-testing | Semiconductor storage devices-testing | Very large scale integrationDDC classification: 621.395
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Item type Current location Call number Status Date due Barcode Item holds
Books Books ISI Library, Kolkata
621.395 B979 (Browse shelf) Available 121422
Total holds: 0

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