Delay fault testing for VLSI Circuits

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Material type: Text

TextLanguage: English Series: Frontiers in electronic testingPublication details: Boston Kluwer Academic 1998Description: xii,191pISBN:

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	ISI Library, Kolkata	621.395 K93 (Browse shelf(Opens below))	Available		126572

Total holds: 0

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Previous	621.395 In61 International conference on VLSI design	621.395 J35 Electronic design automation handbook	621.395 K85 Paths, flows and VLSI-layout	621.395 K93 Delay fault testing for VLSI Circuits	621.395 L193 Principles of modern digital design	621.395 L193 Practical digital logic design and testing	621.395 M182 VLSI design signal processors	Next

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