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VLSI Test principles and architectures design for testability

Contributor(s): Wang Laung-Terng [ed.] | Wen Xiaoqing [ed.] | Wu Cheng-Wen [ed.].
Material type: TextTextSeries: Morgan Kauffman series in systems on silicon. Publisher: Amsterdam Morgan Kaufmann 2006Description: xxx,777p.ISBN: 0-12-370597-5.Subject(s): Integrated circuits-Very large scale integration-design | Integrated circuits-Very large scale integration-testingDDC classification: 621.395
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Item type Current location Call number Status Date due Barcode Item holds
Books Books ISI Library, Kolkata
 
621.395 W246 (Browse shelf) Available 127493
Total holds: 0

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VLSI test principles and architectures ©2006
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