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Model-based testing for embedded systems

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Material type: Text

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TextLanguage: English Series: Computational analysis, synthesis, and design of dynamic systems seriesPublication details: Boca Raton CRC Press 2012Description: xxvii,660pISBN:

978-1-4398-1845-9

Subject(s):

Embedded computer systems-tsting

DDC classification:

004.1 Z27

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Item type	Current library	Call number	Status	Date due	Barcode	Item holds
Books	ISI Library, Kolkata	004.1 Z27 (Browse shelf(Opens below))	Available		134564

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Previous	004.1 W722 Ultimate zero and one	004.1 W722 Explorations in quantum computing	004.1 Y24 Quantum computing for computer scientists	004.1 Z27 Model-based testing for embedded systems	004.11 Al465 Electronic digital computers : their use in science and engineering	004.11 Al465 Electronic digital computers : their use in science and engineering	004.11 Ar676 Introduction to digital computing	Next

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