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Test and diagnosis of analogue, mixed-signal and RF integrated circuits [electronic resource] : the system on chip approach / edited by Yichuang Sun.

Contributor(s): Sun, Yichuang [] | Institution of Engineering and Technology.
Material type: TextTextSeries: IET circuits, devices and systems series: 19.Publisher: London : Institution of Engineering and Technology, 2008Description: 1 online resource (xx, 389 p.) : ill.ISBN: 9780863419997 (electronic bk.); 0863419992 (electronic bk.).Subject(s): Linear integrated circuits -- Testing | Mixed signal circuits -- Testing | Radio frequency integrated circuits -- Testing | TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- Integrated | TECHNOLOGY & ENGINEERING -- Electronics -- Circuits -- GeneralGenre/Form: Electronic books.Additional physical formats: Print version:: Test and diagnosis of analogue, mixed-signal and RF integrated circuits.DDC classification: 621.38150287 Online resources: EBSCOhost
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Includes bibliographical references and index.

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