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Statistical performance analysis and modeling techniques for nanometer VLSI designs / Ruijing Shen, Sheldon X.-D. Tan, Hao Yu.

By: Shen, Ruijing.
Contributor(s): Tan, Sheldon X. D | Yu, Hao.
Material type: TextTextDescription: xxix, 305 pages : illustrations ; 25 cm.ISBN: 9781461407874 (hbk.); 1461407877 (hbk.).Subject(s): Integrated circuits -- Very large scale integration -- Computer-aided design | Integrated circuits -- Very large scale integration -- Statistical methods | Nanoelectronics -- Statistical methods | AlgorithmsDDC classification: 621.395
Contents:
Introduction -- Fundamentals of Statistical Analysis -- Traditional Statistical Leakage Power Analysis Methods -- Statistical Leakage Power Analysis by Spectral Stochastic Method -- Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling -- Statistical Dynamic Power Estimation Techniques -- Statistical Total Power Estimation Techniques -- Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations -- Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method -- Statistical Power Grid Analysis by Variational Subspace Method -- Statistical Capacitance Modeling and Extraction -- Incremental Extraction of Variational Capacitance -- Statistical Inductance Modeling and Extraction -- Performance Bound Analysis of Variational Linearized Analog Circuits -- Stochastic Analog Mismatch Analysis -- Statistical Yield Analysis and Optimization -- Voltage Binning Technique for Yield Optimization.
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Item type Current location Call number Status Date due Barcode Item holds
Books Books ISI Library, Kolkata
 
621.395 Sh546 (Browse shelf) Available 134857
Total holds: 0

Includes bibliographical references (pages 287-297) and index.

Introduction -- Fundamentals of Statistical Analysis -- Traditional Statistical Leakage Power Analysis Methods -- Statistical Leakage Power Analysis by Spectral Stochastic Method -- Linear Statistical Leakage Analysis by Virtual Grid-Based Modeling -- Statistical Dynamic Power Estimation Techniques -- Statistical Total Power Estimation Techniques -- Statistical Power Grid Analysis Considering Log-Normal Leakage Current Variations -- Statistical Power Grid Analysis by Stochastic Extended Krylov Subspace Method -- Statistical Power Grid Analysis by Variational Subspace Method -- Statistical Capacitance Modeling and Extraction -- Incremental Extraction of Variational Capacitance -- Statistical Inductance Modeling and Extraction -- Performance Bound Analysis of Variational Linearized Analog Circuits -- Stochastic Analog Mismatch Analysis -- Statistical Yield Analysis and Optimization -- Voltage Binning Technique for Yield Optimization.

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