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Linear Models for Optimal Test Design [electronic resource] / by Wim J. van der Linden.

By: Contributor(s): Material type: TextTextSeries: Statistics for Social and Behavioral SciencesPublisher: New York, NY : Springer New York, 2005Description: XXIV, 408 p. 44 illus. online resourceContent type:
  • text
Media type:
  • computer
Carrier type:
  • online resource
ISBN:
  • 9780387290546
Subject(s): Additional physical formats: Printed edition:: No title; Printed edition:: No title; Printed edition:: No titleDDC classification:
  • 519.5 23
LOC classification:
  • QA276-280
Online resources:
Contents:
Brief History of Test Theory and Design -- Formulating Test Specifications -- Modeling Test-Assembly Problems -- Solving Test-Assembly Problems -- Models for Assembling Single Tests -- Models for Assembling Multiple Tests -- Models for Assembling Tests with Item Sets -- Models for Assembling Tests Measuring Multiple Abilities -- Models for Adaptive Test Assembly -- Designing Item Pools for Programs with Fixed Tests -- Designing Item Pools for Programs with Adaptive Tests -- Epilogue.
In: Springer eBooksSummary: This book begins with a reflection on the history of test design--the core activity of all educational and psychological testing. It then presents a standard language for modeling test design problems as instances of multi-objective constrained optimization. The main portion of the book discusses test design models for a large variety of problems from the daily practice of testing, and illustrates their use with the help of numerous empirical examples. The presentation includes models for the assembly of tests to an absolute or relative target for their information functions, classical test assembly, test equating problems, item matching, test splitting, simultaneous assembly of multiple tests, tests with item sets, multidimensional tests, and adaptive test assembly. Two separate chapters are devoted to the questions of how to design item banks for optimal support of programs with fixed and adaptive tests. Linear Models for Optimal Test Design, which does not require any specific mathematical background, has been written to be a helpful resource on the desk of any test specialist. Wim J. van der Linden is Professor of Measurement and Data Analysis, University of Twente, The Netherlands. His specialization is psychometric theory and methods, and he has been an active researcher of item response theory throughout his career. His current research is on test design, adaptive testing, test equating, and response-time modeling. Professor van der Linden is a past president of the Psychometric Society and a recipient of the NCME lifetime achievement award for his work on educational measurement.
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Holdings
Item type Current library Call number Status Date due Barcode Item holds
E-BOOKS ISI Library, Kolkata Not for loan EB994
Total holds: 0

Brief History of Test Theory and Design -- Formulating Test Specifications -- Modeling Test-Assembly Problems -- Solving Test-Assembly Problems -- Models for Assembling Single Tests -- Models for Assembling Multiple Tests -- Models for Assembling Tests with Item Sets -- Models for Assembling Tests Measuring Multiple Abilities -- Models for Adaptive Test Assembly -- Designing Item Pools for Programs with Fixed Tests -- Designing Item Pools for Programs with Adaptive Tests -- Epilogue.

This book begins with a reflection on the history of test design--the core activity of all educational and psychological testing. It then presents a standard language for modeling test design problems as instances of multi-objective constrained optimization. The main portion of the book discusses test design models for a large variety of problems from the daily practice of testing, and illustrates their use with the help of numerous empirical examples. The presentation includes models for the assembly of tests to an absolute or relative target for their information functions, classical test assembly, test equating problems, item matching, test splitting, simultaneous assembly of multiple tests, tests with item sets, multidimensional tests, and adaptive test assembly. Two separate chapters are devoted to the questions of how to design item banks for optimal support of programs with fixed and adaptive tests. Linear Models for Optimal Test Design, which does not require any specific mathematical background, has been written to be a helpful resource on the desk of any test specialist. Wim J. van der Linden is Professor of Measurement and Data Analysis, University of Twente, The Netherlands. His specialization is psychometric theory and methods, and he has been an active researcher of item response theory throughout his career. His current research is on test design, adaptive testing, test equating, and response-time modeling. Professor van der Linden is a past president of the Psychometric Society and a recipient of the NCME lifetime achievement award for his work on educational measurement.

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