Online Public Access Catalogue (OPAC)
Library,Documentation and Information Science Division

“A research journal serves that narrow

borderland which separates the known from the unknown”

-P.C.Mahalanobis


Normal view MARC view ISBD view

Reliability and degradation semiconductor devices and circuits

Contributor(s): Howes M J [ed.] | Morgan D V [ed.].
Material type: TextTextPublisher: Chichester John Wiley 1981Description: xii,444p.Subject(s): Electronic circuitsDDC classification: 621.38152
Tags from this library: No tags from this library for this title. Log in to add tags.
Item type Current location Call number Status Date due Barcode Item holds
Books Books ISI Library, Kolkata
 
621.38152 H859 (Browse shelf) Available 101023
Total holds: 0

There are no comments for this item.

Log in to your account to post a comment.
Library, Documentation and Information Science Division, Indian Statistical Institute, 203 B T Road, Kolkata 700108, INDIA
Phone no. 91-33-2575 2100, Fax no. 91-33-2578 1412, ksatpathy@isical.ac.in


Visitor Counter